Photothermal Stability of Various Module Encapsulants and The Effects of Superstrate and Substrate Materials Studied for PVMaT Sources
نویسنده
چکیده
This paper briefs the photothermal reliability studies we conducted on different encapsulation materials for some U.S. PV companies that are subcontractors of the Photovoltaic Manufacturing Technology (PVMaT) program. The results indicate that the photothermal stability of two foreign ethylene vinyl acetate (EVA) films is dependent on the formulation, curing method and condition, as well as accelerated exposure condition and time. With a Tefzel or Tedlar superstrate or substrate, no EVA discoloration was observed. Delamination and/or wrinkling were observed for some thin-film superstrate materials and non-EVA encapsulants. Silicone adhesive caused notable electrical degradation on crystalline and amorphous silicon (c-Si and a-Si) solar cell samples.
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